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Appendix: Personnel & Enrollment
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PHYS
427
Analytical Techniques in Instrumentation
3 cr : 2 cr lecture, 1 cr lab
Prerequisites: PHYS 325 or consent of instructor. Offered in fall.
Microscopy: image formation, contrast, magnification, resolution ; diffraction, near and far field limits. Image formation techniques: Transmission Electron Microscopy (TEM) and Scanning Electron Microscopy (SEM), Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM).
Crystallography: X-ray diffraction. Surface analysis techniques: Auger Electron Spectroscopy (XFS); Bulk analysis techniques: Rutherford Backscattering Spectroscopy (RBS), Secondary Ion Spectroscopy (SIMS); Mass Chemical analysis: IR analyzers.